Electrostatic Discharge (ESD); Test Methodologies & Control Techniques

Dr. Donna Robinson-Hahn
Friday, March 24, 2006
1:30PM - HPA (Health & Public Affairs) - room 112

Abstract


Have you ever touched a doorknob in the dead of winter and gotten a painful shock? Or sat for hours working at your PC and suddenly locked up the screen, resulting in a reboot and loss of all your work? More than likely this was not a software issue. It may have been static.

Electrostatic Discharge (also known as ESD) accounts for billions of dollars in losses to the electronics industry and the losses continue. Dr. Robinson-Hahn will discuss what can be done to prevent static damage during integrated circuit design, test, manufacture and end use. Topics will include device test methodologies, material testing, ESD control techniques and how to simulate common ESD events. The presentation will also include a variety of interesting demonstrations to supplement the lecture material.

Short Bio


Dr. Donna Robinson-Hahn, Director of ESD Engineering for Fairchild Semiconductor has over 20 years of experience in Electrostatic Discharge (ESD), which is one of the leading causes of electronic device failure during manufacture as well as field and consumer use. Donna.s background includes having previously worked in ESD research while at AT&T Bell Labs, as well as overseeing the worldwide ESD & EOS programs for Lucent Technology.s IC Division and their spinoff, Agere Systems. Donna has served on the ESD Association.s Board of Directors and has presented at a variety of conferences. She is a frequent invited guest speaker at a variety of venues both here and abroad. Her research has been published in the EOS/ESD Magazine, Circuits Manufacturing, Threshold Journal, Compliance Engineering, EOS/ESD Technology and the AT&T Bell Labs Technical Journal. She is also a coauthor on numerous ESD industry test standards.