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NATURE: A Hybrid Nanotube/CMOS Dynamically Reconfigurable Architecture
Dr. Niraj K. Jha
Abstract Use of the highly-dense NRAMs allows on-chip multi-context configuration storage, enabling fine-grain (even cycle-by-cycle) temporal logic folding of a circuit before being mapped to the architecture. This can significantly increase the logic density of NATURE (by over an order of magnitude) relative to traditional reconfigurable architectures, while remaining competitive in performance. We will also present an integrated design and optimization platform for NATURE, called NanoMap. Given a mixed RTL/gate-level design, NanoMap optimizes and implements the design in NATURE through logic mapping, temporal clustering, placement, and routing. NanoMap can automatically explore and identify the best temporal logic folding configuration, targeting area, delay or area-delay product as the optimization objective. Experimental results demonstrate that NanoMap can reduce the area-delay product of a design by over an order of magnitude, and effectively exploit the different features of NATURE.
Short BioNiraj K. Jha received his B.Tech. degree in Electronics and Electrical Communication Engineering from Indian Institute of Technology, Kharagpur, India in 1981 and Ph.D. degree in Electrical Engineering from University of Illinois at Urbana-Champaign in 1985. He is a Professor of Electrical Engineering at Princeton University. He is a Fellow of IEEE and ACM. He has served as the Director of the Center for Embedded System-on-a-chip Design funded by New Jersey Commission on Science and Technology. A textbook he co-authored titled ``Testing of Digital Systems" is being used widely around the world. He is the editor-in-chief of TVLSI and serves on the editorial boards of TCAD and TCAS II. He has co-authored seven papers which have won Best Paper Awards. His research interests include nanotechnology, embedded system analysis and design, power/thermal aware hardware/software design, computer-aided design of ICs and systems, computer security, and digital system testing.
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